Accurate Atomic-Scale Imaging of Two-Dimensional Lattices Using Atomic Force Microscopy in Ambient Conditions

S. Kim, D. Moon, B. R. Jeon, J. Yeon, X. Li, and S. Kim, “Accurate Atomic-Scale Imaging of Two-Dimensional Lattices Using Atomic Force Microscopy in Ambient Conditions,” Nanomaterials, vol. 12, no. 9, pp. 1542.