Citation:Kim, S. ; Moon, D. ; Jeon, B. R. ; Yeon, J. ; Li, X. ; Kim, S. Accurate Atomic-Scale Imaging of Two-Dimensional Lattices Using Atomic Force Microscopy in Ambient Conditions. Nanomaterials 12, 1542. Copy at http://www.tinyurl.com/28wr2qqvDownload Citation
